Event Code:
Date:
Time:
Location:
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STS – S5
Thursday, 20 May 2010
09:30 – 13:30
Level 3, Suntec Singapore
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Session Chair:
Mr Jeffrey Lam
Senior Director
GLOBALFOUNDRIES Singapore Pte Ltd
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[09:20 – 09:30]
Semi Address and Introduction
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[09:30 – 10:15]
Keynote: Cost of Test Operation
Octavio Martínez
Senior Director of Engineering
Qualcomm Inc.
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[10:15 – 10:45]
Benefits of Flip Chip Wafer Sort Using MEMs Multi Site Capability
Mr. Lo Wee Tick
Turnkey Wafer Sort Manager
GLOBALFOUNDRIES Singapore Pte Ltd
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[10:45–11:15]
RF Vector Calibration to the End of Probe Needles using LRL (Line – Reflect – Line) Approach
Mr. Steffen Chladek
Business Development Manger
LTX – Credence
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[11: 15–11:30]
Break
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[11: 30–12:00]
Mr. Rathinakumar Vaidyanathan
Director, Supply Chain and PLM Applications – Asia Pacific
Oracle Corporation
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[12: 00–12:30]
Concurrent Testing
Mr. Charles Fei
Field Product Specialist
Teradyne (Asia) Pte Ltd.
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[12: 30–13:00]
Quantifying RF Concurrent Test as a Means to Reduce Operational CoT
Mr. Anthony Lum
SoC Product Engineer
Advantest America, Inc.
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[13: 00–13:30]
Optimization of Test Hardware/ Software for Test Cost Reduction
Mr. Goh Szu Huat
GLOBALFOUNDRIES Singapore Pte Ltd
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